Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for a representative (741 type) opamp. The circuit is simulated under both linear and nonlinear operation. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method.
Papakostas, D. and Hatzopoulos, A. (1994). Supply current testing in linear bipolar ICs. Electronics Letters [online]. 30(2), pp.128-130. Διαθέσιμο σε: http://digital-library.theiet.org/content/journals/10.1049/el_19940088 [Ανακτήθηκε 19 Ιουλίου 2015]