This item is provided by the institution :
Technological Educational Institute of Athens
Repository :
Ypatia - Institutional Repository
see the original item page
in the repository's web site and access all digital files if the item*
share




2004 (EN)
Material origins of line-edge roughness (EN)

Πάτσης, Γεώργιος (EL)
Γογγολίδης, Ευάγγελος (EL)
Κωνσταντούδης, Βασίλειος (EL)

N/A (EN)

A fast 2D/3D resist dissolution algorithm is used to quantify line-edge roughness and determine its relation to resist material parameters, such as the polymerization length distribution, the end-to-end distance and the radius of gyration, along with the effects of acid-diffusion. The same relation between surface roughness and exposure dose known to hold experimentally is also shown to be valid for line-edge roughness. Increasing average polymerization length results in increased values of line-edge roughness, radius of gyration and end-to-end distance establishing an immediate relation between material properties and measured line-edge roughness (LER). The effects of the edge depth and length of measurement and of the free volume on LER vs. are also investigated. (EN)

conferenceItem
poster

Πολυμερισμός (EN)
Polymerization (EN)
LER (EN)
Surface roughness (EN)
Τραχύτητα επιφάνειας (EN)

ΤΕΙ Αθήνας (EL)
Technological Educational Institute of Athens (EN)

Advances in Resist Technology and Processing XXI (EN)

English

2004-02-22

DOI: 10.1117/12.535202

SPIE (EN)



*Institutions are responsible for keeping their URLs functional (digital file, item page in repository site)