A model for the analysis of nonlinear interactive problems between TE and TM waves based on the resonance technique

 
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Journal part (EN)
Scientific article (EN)
1995 (EN)
A model for the analysis of nonlinear interactive problems between TE and TM waves based on the resonance technique (EN)
Stathopoulos, NA (EN)
Kanellopoulos, JD (EN)
A simple and easily programmable approach based on the resonance method has been developed for analysing the nonlinear interaction between TE and TM waves. The model is oriented to be applicable to complicated nonlinear interactive problems, such as multilayer dielectric structures with arbitrary nonlinear media, two-dimensional nonlinear guides, nonisotropic nonlinear media, etc. In this paper, the five-layer waveguiding configuration containing two nonlinear media, along with a linear film of arbitrary refractive index profile, is treated. The dielectric tensor considered is of more general nonlinearity and not only the Kerr type. The theory is illustrated by a set of numerical results in which loci of interactive waves in the βTEβ-TE plane, field profiles and guided powers are presented. Some useful conclusions are derived. © 1995 Chapman & Hall. (EN)
journalArticle (EN)
Dielectric materials (EN)
Refractive index (EN)
Engineering, Electrical & Electronic (EN)
Optics (EN)
Transverse magnetic waves (EN)
Two dimensional (EN)
Kerr nonlinearities (EN)
Optical waveguides (EN)
Finite element method (EN)
Tensors (EN)
Electromagnetic wave propagation (EN)
Optical Kerr effect (EN)
Transverse electric waves (EN)
Dielectric thin films (EN)
Nonlinear media (EN)
Refractive Index (EN)
Approximation theory (EN)
Mathematical models (EN)
Resonance (EN)
National Technical University of Athens
Digital Library of National Technical University of Athens | Dspace@NTUA
Κεντρική Βιβλιοθήκη Ε.Μ.Π.
Ιδρυματικό Αποθετήριο
Δημοσιεύσεις μελών Δ.Ε.Π. σε περιοδικά
Optical and Quantum Electronics (EN)
English
1995 (EN)
http://hdl.handle.net/123456789/11420
594 (EN)
27 (EN)
577 (EN)
6 (EN)
0306-8919 (EN)
10.1007/BF00563141 (EN)
ISI:A1995RE99900002 (EN)
Kluwer Academic Publishers (EN)



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