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Interfacial layer as an evaluation criterion of electrical contacts
This item is provided by the institution :
National Technical University of Athens
Repository :
Digital Library of National Technical University of Athens | Dspace@NTUA
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ΕΚΤ item type
Journal part
(EN)
Scientific article
(EN)
EKT year
1996
(EN)
EKT historical period
Title
Interfacial layer as an evaluation criterion of electrical contacts (EN)
Creator
Filippakou, MP (EN)
Karagiannopoulos, CG (EN)
Bourkas, PD (EN)
Description
Stationary switch contacts of practical applications may present nonlinear current-voltage behaviour and phase shift effects. These phenomena are related to the appearance of tunnelling currents in the interfacial layer at high electric fields. In the paper experimental data are presented, and a theoretical investigation is attempted concerning these phenomena. The results lead to a new method for the quality evaluation of stationary electrical contacts. This method is based on measurements of the voltage drop waveforms on contacts under test. From the experimental and theoretical results, it can be concluded that the operation of adequately oxidised contacts (in a state of degradation) appears to be improved when they are strained for a short time period by current values greater than the nominal ones. This can be attributed to the breakdown of the interfacial layer as impact ionisation occurs, and new paths through metallic spots are created. © IEE, 1996. (EN)
Type
journalArticle (EN)
Subject
Interfacial layer (EN)
Stationary switch contacts (EN)
Voltage measurement (EN)
Evaluation criterion (EN)
Electric contacts (EN)
Waveform analysis (EN)
Engineering, Electrical & Electronic (EN)
Electric switches (EN)
Current voltage characteristics (EN)
Electric currents (EN)
Electrical contacts (EN)
Electric field effects (EN)
Interfaces (materials) (EN)
Ionization of solids (EN)
Voltage drop waveforms (EN)
Electric current measurement (EN)
Provider
National Technical University of Athens
Repository / collection
Digital Library of National Technical University of Athens | Dspace@NTUA
Subcollections
Κεντρική Βιβλιοθήκη Ε.Μ.Π.
Ιδρυματικό Αποθετήριο
Δημοσιεύσεις μελών Δ.Ε.Π. σε περιοδικά
Journal
IEE Proceedings: Science, Measurement and Technology (EN)
Language
English
Issued
1996 (EN)
Identifier
http://hdl.handle.net/123456789/11920
143 (EN)
2 (EN)
146 (EN)
1350-2344 (EN)
10.1049/ip-smt:19960127 (EN)
ISI:A1996UL75700012 (EN)
Publisher
IEE-INST ELEC ENG (EN)
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