Κεφαλάς, Αλκιβιάδης ΚωνσταντίνοςΣαραντοπούλου, ΕυαγγελίαArgitis, PanagiotisBellas, VassiliosSiokou, Ageliki ElinaΚόλλια, ΖωήKobe, SpomenkaMELVILLEThin films of ethyl polyhedral oligomeric silsesquioxane (ethyl-POSS) containing polymers at different compositions were chemically modified using laser irradiation at 157 nm. The irradiation caused photodissociation of C-O and C-H bonds followed by the formation of new chemical bonds. The content of Si-O and C-O bonds increased, as did the surface hardness. Vacuum ultraviolet (VUV) absorption, mass spectrometry, x-ray photoelectron spectroscopy, and atomic force microscopy imaging and indentation were used to evaluate the effects of the 157 nm irradiation. The chemical modification was restricted to a thin surface layer. The layer depth was determined by the penetration depth of the 157 nm VUV photons inside the thin copolymer layer. With prolonged VUV irradiation, the absorbance of the polymers increased, eventually becoming saturated. The chemical changes were accompanied by surface hardening, as evidenced by the increase in the Young's modulus from 4 to 24 GPa due to glassification of the irradiated parts. The chemically modified layer acts as a shield against photodissociation and degradation of the deeper portion of the POSS polymer by VUV radiation. Applications include the protection of solar cells on low orbit satellites from solar VUV photons.[11]0021-897910.1063/1.3131822https://hdl.handle.net/10442/12678engAmerican Institute of Physics© 2009 American Institute of Physics. [DOI: 10.1063/1.3131822]© 2009 American Institute of Physics. [DOI: 10.1063/1.3131822]Journal of Applied PhysicsPhysics, AppliedSurface modification of polyhedral oligomeric silsesquioxane block copolymer films by 157 nm laser lightΆρθρο σε επιστημονικό περιοδικό2009-06-01Δημοσίευση σε περιοδικόPublication in journalΦυσικήPhysical sciencesFrascati 42Επιστημονικό άρθροScientific articleΕθνικό Ίδρυμα Ερευνών (ΕΙΕ)Greek Aggregator OpenArchives.gr | National Documentation Centre (EKT)