Vapor sorption in thin supported polymer films studied by white light interferometry

 
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2006 (EN)
Vapor sorption in thin supported polymer films studied by white light interferometry (EN)

Μανώλη, Κυριακή (EL)
Βαλαμόντες, Ευάγγελος Σ. (EL)
Γουστουρίδης, Δημήτριος (EL)
Χατζανδρούλης, Σταύρος Ε. (EL)
Ράπτης, Ιωάννης Α. (EL)

Σανοπούλου, Μερόπη (EL)
N/A (EN)

In the present study, we apply a white light interferometric methodology to study sorption of moisture and methanol vapor in thin films of poly(2-hydroxyethyl methacrylate) [PHEMA] and poly(methyl methacrylate) [PMMA], supported on oxidized silicon wafers. The measured equilibrium thickness expansion of each film, exposed to different activities of the vapor penetrant, is used to determine the sorption isotherm of the system. Results for relatively thick films (100 nm < Lo < 600 nm) are compared with corresponding literature data for bulk, free-standing films, obtained by direct gravimetric methods. Furthermore, PMMA films of thicknesses lower than 100 nm were employed in order to study the effect of the dry film's thickness, and of substrate, on fractional swelling. (EN)

journalArticle

Polymethylmethacrylate (EN)
Προσρόφηση ατμών (EN)
Vapor sorption (EN)
Πολυ (μεθακρυλικό μεθύλιο) (EN)
Poly(2-hydroxyethyl methacrylate) (EN)

ΤΕΙ Αθήνας (EL)
Technological Educational Institute of Athens (EN)

Polymer (EN)

English

2006-08-09

DOI: 10.1016/j.polymer.2006.06.016

Elsevier (EN)



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