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Dielectric study of the double helix to single coil transition of DNA
This item is provided by the institution :
National Technical University of Athens
Repository :
Digital Library of National Technical University of Athens | Dspace@NTUA
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ΕΚΤ item type
Journal part
(EN)
Scientific article
(EN)
EKT year
1998
(EN)
EKT historical period
Title
Dielectric study of the double helix to single coil transition of DNA (EN)
Creator
Konsta, AA (EN)
Haveles, KS (EN)
Sideris, EG (EN)
Georgakilas, AG (EN)
Description
In this work, we investigate the dielectric behavior of mammalian DNA macromolecules of different sizes in aqueous solution, by dielectric relaxation spectroscopy in the frequency range 100 Hz to 1 MHz, during the double helix to single coil thermal transition, in association with the gradual disruption of the hydrogen bonds between the complementary nitrogenous bases of the DNA double helix, measured by thermal transition spectrophotometry. Our results have shown that, when the temperature of DNA samples is gradually increasing, changes in specific conductivity σdc precede changes in A260 absorbance at the UV region, where A260 is related to the disruption of the hydrogen bonds between the two DNA strands. The presented experimental evidence extends the validation of multistage models for this transition phase to the case of large size mammalian native macromolecular DNA. © 1998 IEEE. (EN)
Type
journalArticle (EN)
Subject
DISPERSION (EN)
Engineering, Electrical & Electronic (EN)
RELAXATION (EN)
Nitrogen (EN)
STRAND BREAK FORMATION (EN)
Hydrogen Bond (EN)
Physics, Applied (EN)
AQUEOUS-SOLUTION (EN)
FLUCTUATION (EN)
TEMPERATURE (EN)
CONDUCTIVITY (EN)
SYSTEMS (EN)
Aqueous Solution (EN)
Dielectric Relaxation (EN)
Provider
National Technical University of Athens
Repository / collection
Digital Library of National Technical University of Athens | Dspace@NTUA
Subcollections
Κεντρική Βιβλιοθήκη Ε.Μ.Π.
Ιδρυματικό Αποθετήριο
Δημοσιεύσεις μελών Δ.Ε.Π. σε περιοδικά
Journal
IEEE Transactions on Dielectrics and Electrical Insulation (EN)
Language
English
Issued
1998 (EN)
Identifier
http://hdl.handle.net/123456789/12657
1070-9878 (EN)
1 (EN)
26 (EN)
10.1109/94.660755 (EN)
5 (EN)
ISI:000072527500006 (EN)
32 (EN)
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC (EN)
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