A design for testability scheme for CMOS LC-Tank voltage controlled oscillators
(EN)
Dermentzoglou, L.
(EN)
Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
(EL)
Dermentzoglou, L.
(EN)
In this paper, anew Design for Testability (DFT) scheme is proposed, for the testing of LC-tank CMOS Voltage Controlled Oscillators (VCOs). The proposed test-circuit is capable of detecting hard (catastrophic) and soft (parametric) faults, injected in the VCO. The test result is provided by a digital Fail/Pass signal. Simulation results reveal the effectiveness of the proposed circuit. The overall silicon area requirement of the proposed DFT scheme is negligible.
(EN)
