Reliability issues and electrical characteristics of rare-earth oxides and their gate stacks grown on germanium substrates

This item is provided by the institution :

Repository :
Repository of UOI Olympias

see the original item page
in the repository's web site and access all digital files if the item^*

ΕΚΤ item type

PhD thesis (EN)

EKT year

2009 (EN)

EKT historical period

Title

Reliability issues and electrical characteristics of rare-earth oxides and their gate stacks grown on germanium substrates (EL)

Creator

Shahinur, Rahman (EN)

Contributor

Evangelou, E. (EL)

Shahinur, Rahman (EN)

Floudas, G. (EN)

Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Φυσικής

Type

doctoralThesis

Subject

Provider

University of Ioannina

Repository / collection

Subcollections

Τμήμα Φυσικής

Language

English

Issued

2009

Identifier

Δ.Δ. RAH 2009

https://olympias.lib.uoi.gr/jspui/handle/123456789/1246

Publisher

Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Φυσική (EL)