Dielectric reliability degradations in rare earth oxides (REOs) based gate stacks grown on Germanium substrates

Rahman, M. S.

Dimoulas, A.

Evangelou, E. K.

Konofaos, N.

Conference / Συνέδριο

info:eu-repo/semantics/conferenceObject

Αριστοτέλειο Πανεπιστήμιο Θεσσαλονίκης

Ιδρυματικό Καταθετήριο Επιστημονικών Εργασιών ΑΠΘ

IKEE Conference Announcements

Αγγλική γλώσσα

2013-06-05T16:55:10Z

2012

http://ikee.lib.auth.gr/record/201591

Αριστοτέλειο Πανεπιστήμιο Θεσσαλονίκης, Σχολή Θετικών Επιστημών, Τμήμα Πληροφορικής

9th International Conference on Nanosciences & Nanotechnologies (NN12), [2012]

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info:eu-repo/semantics/openAccess