Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluation

 
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Conference article (EN)
Scientific article (EN)
2007 (EN)
Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluation
Papakostas, Dimitrios
Hatzopoulos, Alkiviadis
Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2007
Άλλο
other
Conference article
Other
ATEI of Thessaloniki
Eureka! Insitutional Repository
Σχολή Τεχνολογικών Εφαρμογών - Τμήμα Ηλεκτρονικών Μηχανικών
13th IEEE International Mixed Signal Testing Workshop
English
2007-06
Papakostas, D. and Hatzopoulos, A. (2007). Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluation. In: International Mixed Signal Testing Workshop: conference proceedings, Portugal, 2007. [S.l.]: IEEE, pp.37-41.
http://195.251.240.227/jspui/handle/123456789/10069
International Mixed Signal Testing Workshop, Portugal, 2007
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