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Characterization of Nuclear Targets and Thin Films Using Ion-Beam Techniques

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Hellenic Nuclear Physics Society   

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Annual Symposium of the Hellenic Nuclear Physics Society  | ΕΚΤ eProceedings   

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Characterization of Nuclear Targets and Thin Films Using Ion-Beam Techniques (EN)
Mertzimekis, T. J.
Kanellakopoulos, A.
Paneta, V.
Lagaki, V.
info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
2012-12-01
We report on the characterization of nuclear targets and thin films using standard ion-beam techniques at the Tandem Accelerator Laboratory (TAL) of INPP, NCSR “Demokritos”. The characterization was carried out with the application of Rutherford Backscattering and standard Nuclear Reaction Anal- ysis using both large and small goniometric chambers available at TAL. Results from the measurements and simulations are presented. (EN)
Targets Characterization (EN)
Ion Beams (EN)
Annual Symposium of the Hellenic Nuclear Physics Society
English
Hellenic Nuclear Physics Society (HNPS) (EN)
2654-0088
2654-007X
Annual Symposium of the Hellenic Nuclear Physics Society; Τόμ. 20 (2012): HNPS2012; 160-163 (EL)
HNPS Advances in Nuclear Physics; Vol. 20 (2012): HNPS2012; 160-163 (EN)
Πνευματική ιδιοκτησία (c) 2019 A. Kanellakopoulos, V. Lagaki, T. J. Mertzimekis, V. Paneta (EL)
Hellenic Nuclear Physics Society
Annual Symposium of the Hellenic Nuclear Physics Society



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