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Application of ion beam analysis for the characterization of SiC- and DLC-thin films

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Hellenic Nuclear Physics Society   

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Annual Symposium of the Hellenic Nuclear Physics Society  | ΕΚΤ eProceedings   

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Application of ion beam analysis for the characterization of SiC- and DLC-thin films (EN)
Misaelides, P.
Kokkoris, M.
Noli, F.
Riviere, J. P.
info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
2020-01-01
Three series of protective coatings (thickness ca. 200-300 nm) were prepared on the surface of Ti-Al-V alloy (TA6V): silicon carbide (SiC) films produced by ion sputtering (I), silicon carbide films and subjected to Dynamic Ion Mixing (DIM) during the deposition procedure (II) and Diamond Like Carbon (DLC) films produced by ion beam deposition (III). The chemical composition (Si, C and O) of the films was determined using ion beam analysis techniques. The silicon, carbon and oxygen depth distribution was determined by proton Rutherford backscattering spectrometry (p-RBS) and using the resonances at 4.265 and 3.035 MeV of the 12C(α,α)12C and 16O(α,α)16O interactions respectively. The ratio of Si:C was found to be close to the stoichiometric one. The corrosion resistance of the coated samples was tested under strong aggressive conditions (5M HCl at 50 oC). The investigation following the corrosion attack showed that the thickness of the films remained practically unchanged. Only slight diffusion and dissolution effects were observed indicating the good quality of the produced thin films. (EN)
Annual Symposium of the Hellenic Nuclear Physics Society
Αγγλική γλώσσα
Hellenic Nuclear Physics Society (HNPS) (EN)
2654-0088
2654-007X
Annual Symposium of the Hellenic Nuclear Physics Society; Τόμ. 15 (2006): HNPS2006; 269-272 (EL)
HNPS Advances in Nuclear Physics; Vol. 15 (2006): HNPS2006; 269-272 (EN)
Πνευματική ιδιοκτησία (c) 2019 F. Noli, P. Misaelides, M. Kokkoris, J. P. Riviere (EL)
Hellenic Nuclear Physics Society
Annual Symposium of the Hellenic Nuclear Physics Society



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