APPLICATION OF THE RESONANCE TECHNIQUE FOR THE EVALUATION OF TE AND TM MODES GUIDED BY SUCCESSIVE NON-KERR NONLINEAR DIELECTRIC PLANAR LAYER STRUCTURES

 
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1993 (EN)
APPLICATION OF THE RESONANCE TECHNIQUE FOR THE EVALUATION OF TE AND TM MODES GUIDED BY SUCCESSIVE NON-KERR NONLINEAR DIELECTRIC PLANAR LAYER STRUCTURES (EN)

KANELLOPOULOS, JD (EN)
STATHOPOULOS, NA (EN)

N/A (EN)

A simple and easily programmable method based on the resonance technique has been developed for analysing successive optical nonlinear layers bounded by linear media. We consider here nonlinear media of the general type (non-Kerr media) including the more complicated but realistic case of saturable media. In this formulation both TE and TM polarization are examined. In the present paper as an example of the proposed methodology, the five layers waveguiding configuration, including three nonlinear planar layers bounded by linear cladding and substrate media is treated. The results obtained by this method include both field distribution and power calculations (EN)

journalArticle

THIN-FILMS (EN)
WAVE-GUIDES (EN)
Layered Structure (EN)
MEDIA (EN)
INDEX (EN)
SLAB (EN)

Εθνικό Μετσόβιο Πολυτεχνείο (EL)
National Technical University of Athens (EN)

JOURNAL OF MODERN OPTICS (EN)

1993


TAYLOR & FRANCIS LTD (EN)



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