Raman scattering in sputtered amorphous Ge25Se75-xBix films
(EN)
Mytilineou, E
(EN)
Chao, BS
(EN)
Papadimitriou, D
(EN)
Raman spectra of sputtered amorphous Ge25Se75-xBix films, with x from 0 to 19, have been studied. For x = 0 the typical spectrum of an amorphous GeSe3 glass is obtained. It is dominated by the peaks at 200 and 220 cm(-1), characteristic of the Ge(Se-1/2)(4) tetrahedra and a broad peak at 265 cm(-1), due to the excess Se-Se bonds. The intensity of the 200, 220, 265 cm(-1) peaks decrease and a new broad asymmetric peak appears at 175 cm(-1) whose intensity increases with the increase of the amount of Bi incorporated into the films, This later peak is attributed to Bi2Se3 structural units.
(EN)
