XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin films

 
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1997 (EN)
XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin films (EN)

Frey, U (EN)
Palles, D (EN)
Holiastou, M (EN)
Poulakis, N (EN)
Niarchos, D (EN)
Liarokapis, E (EN)
Adrian, H (EN)

N/A (EN)

Micro Raman characterization is performed on high quality thin films of Bi2Sr2CuO6+x (2201), Bi2Sr2CaCu2O8+x (2212), Bi2Sr2Ca2Cu3O10+x (2223) made by dc-sputtering. Single crystal x-ray measurements reveal the full epitaxy of the films, which allows for polarized Raman spectra to be obtained. (EN)

journalArticle

Polarization (EN)
X Rays (EN)
High temperature superconductors (EN)
Micro Raman spectroscopy (EN)
Raman spectroscopy (EN)
Sputtering (EN)
Single crystals (EN)
Superconducting films (EN)
X ray crystallography (EN)
Single Crystal (EN)
Raman Spectra (EN)
Bismuth compounds (EN)
Oxide superconductors (EN)
Epitaxial growth (EN)
Thin Film (EN)
Bismuth strontium calcium copper oxide (EN)

Εθνικό Μετσόβιο Πολυτεχνείο (EL)
National Technical University of Athens (EN)

Physica C: Superconductivity and its Applications (EN)

English

1997


ELSEVIER SCIENCE BV (EN)



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