Electrical properties of magnetron sputtered amorphous carbon films with sequential sp(3)-rich/sp(2)-rich layered structure

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Electrical properties of magnetron sputtered amorphous carbon films with sequential sp(3)-rich/sp(2)-rich layered structure (EN)

Panayiotatos, Y (EN)
Logothetidis, S (EN)
Hastas, NA (EN)
Dimitriadis, CA (EN)
Papadimitriou, D (EN)
Tassis, DH (EN)

journalArticle (EN)

2014-03-01T01:51:09Z
2001 (EN)


The electrical properties of thick amorphous carbon (a-C) films with sequential sp(3)-rich/sp(2)-rich layered structure, grown by magnetron sputtering on Si substrates at room temperature, were investigated. At low electric fields, the conduction is due to the variable range hopping mechanism. At high electric fields, thermally assisted band-to-band indirect tunneling is the dominant conduction mechanism, while the Arrhenius plots of the current show a deviation from straight lines in the form of continuous bending satisfying the Meyer-Nelder rule. Comparative studies of low-frequency noise in sp(2)-rich single layer and sp(3)-rich/sp(2)-rich layered a-C films indicate that the noise in the a-C layered originates from traps located mainly at the interfaces of the sp(3)-rich/sp(2)-rich bilayers. (C) 2001 American Institute of Physics. (EN)

Physics, Applied (EN)

MECHANISM (EN)

APPLIED PHYSICS LETTERS (EN)

English

AMER INST PHYSICS (EN)




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