Determination of oxygen content in pulsed laser deposited InN thin films with analytical electron microscopy

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Determination of oxygen content in pulsed laser deposited InN thin films with analytical electron microscopy

Κεφαλάς, Αλκιβιάδης Κωνσταντίνος
Drazic, Goran
Σαραντοπούλου, Ευαγγελία
Κόλλια, Ζωή
Kobe, Spomenka

Περίληψη σε συνέδριο

2009-07


New York

Επιστήμη (Γενικά) (EL)
Τεχνολογία (Γενικά) (EL)
Technology (General) (EN)
Science (General) (EN)

Microscopy
Materials Science, Multidisciplinary

English

Cambridge University Press


Microscopy and Microanalysis

https://rightsstatements.org/page/InC/1.0/?language=en
© CAMBRIDGE UNIV PRESS
© CAMBRIDGE UNIV PRESS (EN)




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