STUDY OF THE MULTIPLICITY OF DIELECTRIC RELAXATION TIMES IN ICE AT LOW TEMPERATURES.

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Title

STUDY OF THE MULTIPLICITY OF DIELECTRIC RELAXATION TIMES IN ICE AT LOW TEMPERATURES. (EN)

Creator

Apekis, L (EN)

Pissis, P (EN)

Type

conferenceItem (EN)

Conference item (EN)

Issued

2014-03-01T02:40:51Z

1987 (EN)

Year

1987 (EN)

Description

By the use of several experimental techniques offered by the method of thermally stimulated depolarization (TSD), it was demonstrated that the low temperature TSD peak of polycrystalline ice Ih, which is due to the dipolar polarization mechanism of ice in this temperature range, consists of a secondary component at 108K and a main peak at 119K. The characteristics of the secondary component are: activation energy W equals 0. 24eV, pre-exponential factor in the Arrhenius equation tau //o equals 7. 4 multiplied by 10** minus **9s and dielectric strength approximately 4% of the whole peak. The main peak can be described by a dielectric relaxation mechanism characterised by a continuous distribution of relaxation times, with both W and tau //o being distributed parameters, with mean values of 0. 31eV and 5 multiplied by 10** minus **1**2s respectively. An attempt has been made to interpret the results at the molecular level. (EN)

Scientific field

Physics, Multidisciplinary (EN)

Natural Sciences
Physical sciences (EN)

Subject

THERMAL EFFECTS (EN)

DIELECTRIC RELAXATION TIMES (EN)

THERMALLY STIMULATED DEPOLARIZATION (EN)

DIPOLAR POLARIZATION (EN)

LOW TEMPERATURES (EN)

Low Temperature (EN)

ICE (EN)

Dielectric Relaxation (EN)